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Grant
UA II-VI Deflectometry Project
Sponsored by II-VI Incorporated
$160K Funding
2 People
External
Related Topics
deflectometry,
optical metrology,
ua ii-vi materials,
surface inspection,
metrology techniques
People
Daewook Kim
Principal Investigator (PI)
James C Wyant Coll Optical Sci
﹒Associate Professor
Heejoo Choi
Co-Investigator (COI)
James C Wyant Coll Optical Sci
﹒Associate Research Professor
